Posts Tagged ‘semiconductor die’

First Through-Silicon Via Foundry, ALLVIA, Completes Reliability Testing of Silicon Interposer

First Through-Silicon Via Foundry, ALLVIA, Completes Reliability Testing of Silicon Interposer

ALLVIA, the first through-silicon via (TSV) foundry, has completed the integration of a silicon interposer between a semiconductor die and an organic or ceramic substrate and completed full reliability testing. This 3D integration of substrates is all made possible with... (Continue reading)